Labtron LXRD-A10 Powder X-ray Diffraction System

Powder X-ray diffraction (XRD) is the principal technique for identifying and quantifying crystalline phases in solid materials, and remains one of the most widely used non-destructive analytical methods across materials science, chemistry, geology, and pharmaceutical research. The Labtron LXRD-A10 employs a horizontal-goniometer configuration allowing the system to scan across a broad 10°–164° 2θ range while directing a monochromatic X-ray beam onto a powdered or solid sample. As the sample and detector rotate through this angular range, the instrument records the angles and relative intensities of diffracted beams that satisfy Bragg's Law, producing a diffraction pattern unique to the crystalline phases present. The system is fitted with X-ray tube, a standard Cu target for routine work, operating across a tube voltage range of 10–60 kV and tube current range of 5–80 mA, giving operators flexibility to balance resolution, intensity, and scan speed for different sample types. Data is collected via a proportional/scintillation counter detector, which delivers high angular resolution and reproducible intensity measurements suitable for both rapid qualitative screening and slower, statistically robust quantitative work.

Analytical Capabilities & Compatible Sample Types

Applicable to any crystalline or semi-crystalline solid material that can be presented as a flat powder bed, pressed pellet, or polished bulk/thin-film surface.

• Powders & Bulk Solids — Minerals, ceramics, metals, alloys, and inorganic compounds.
• Pharmaceutical Solids — Polymorph screening, crystallinity, and API/excipient phase identification.
• Nanomaterials & Catalysts — Phase purity, crystallite size, and structural confirmation of synthesized nanomaterials, MOFs, and catalysts.
• Thin Films & Coatings — Phase and orientation analysis of deposited films.
• Cement, Clay & Construction Materials — Mineralogical phase quantification.