Labtron LXRD-A10 Powder X-ray Diffraction System

Powder X-ray diffraction (XRD) is the principal technique for identifying and quantifying crystalline phases in solid materials. The Labtron LXRD-A10 employs a horizontal-goniometer configuration with an auto-switching dual-wavelength optic, directing a monochromatic X-ray beam onto a powdered or solid sample and recording the angles and intensities of diffracted beams that satisfy Bragg's Law. The resulting diffraction pattern acts as a structural fingerprint, enabling phase identification, quantitative phase analysis, crystallite-size estimation, and unit-cell/lattice-parameter refinement.

The system is fitted with a selectable X-ray tube (standard Cu target, with Fe, Co, Cr, and Mo targets available for specialized applications) and a proportional/scintillation counter detector, delivering high angular resolution and reproducible intensity data suitable for both qualitative search-match identification (against ICDD/PDF-type reference databases) and quantitative Rietveld-based analysis.

Analytical Capabilities & Compatible Sample Types

Applicable to any crystalline or semi-crystalline solid material that can be presented as a flat powder bed, pressed pellet, or polished bulk/thin-film surface.

• Powders & Bulk Solids — Minerals, ceramics, metals, alloys, and inorganic compounds.
• Pharmaceutical Solids — Polymorph screening, crystallinity, and API/excipient phase identification.
• Nanomaterials & Catalysts — Phase purity, crystallite size, and structural confirmation of synthesized nanomaterials, MOFs, and catalysts.
• Thin Films & Coatings — Phase and orientation analysis of deposited films.
• Cement, Clay & Construction Materials — Mineralogical phase quantification.